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XJP-403J、403JT、403JA、403JAT
Category: Metallurgical Microscope
Publish Time: 2014-04-23 06:41
This series microscope is widely used in observation & analysis of metallurgical organization in Mechanical industry, Research of Geological & Mineral department and viewing & measuring crystal, integrate circuit, micro-electronics, etc in Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figure and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.
Specification
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Model
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XJP-403J
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XJP-403JT
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XJP-403JA
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XJP-403JAT
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Viewing head
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Compensation Free Binocular Head. Inclined
at 45 ° ( 50mm -75mm )
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Compensation Free Trinocular Head.
Inclined at 45 ° ( 50mm -75mm )
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Eyepiece
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WF10 × /20mm
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WF10 ×/ 22mm
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WF10 × /20mm with reticule 0.1mm
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Nosepiece
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Quadruple nosepiece
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Quintuple nosepiece
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Objective
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195 metallurgical
objectives
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4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .11mm
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20 × /0.4W.D .9mm
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40 × /0.6W.D. 3.8mm
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Infinity metallurgical
objectives
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4 × /0.1W.D .25mm
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10 ×/ 0.25W.D .12mm
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20 × /0.4W.D .10mm
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40 × /0.6W.D. 7.1mm
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50 × /0.75W.D. 1.9mm 80 (S)× /0.9W.D. 0.9mm
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Stage
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Double layers mechanical stage
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Stage size: 242mm × 172mm
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Central stage: Φ110mm
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Moving range: 75mm × 50mm
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Focusing
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Coaxial coarse & fine focusing adjustment with
rack and pinion mechanism Fine focusing scale
Value 0.002mm
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Illumination
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Epi-Kohler illumination. With aperture
iris diaphragm and field iris diaphragm.
12V/30W.AC85V-230V Adjustable brightness
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Filter
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Blue, green, yellow
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Polarizing outfit
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Analyzer rotatable 360 ° ,polarizer & Analyzer
can be slided slided in / out of the optical path
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Checking tool
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0.01mm micrometer
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Optional Accessory
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1.3、2.0、3.0、5.0 Mega pixels CMOS electronic eyepiece
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Photography attachmrnt
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